INIDS2-1668
Synchrotron-based Analytical Techniques for Cosmetic Materials at PLS-II
Topic
IDS2. Frontiers in Cosmetic Science and Technology (Sponsored by COSMAX)
When and Where
Sep 30, 2026
11:10 - 11:35
Room 102
Session Chairs
Jungmoo HEO
Presenter(s)
Young Hwa Jung (Pohang Accelerator Laboratory)
Co-Author(s)
Abstract
Cosmetic products are complex soft materials whose performance is governed by structural and chemical features spanning molecular to microscopic length scales. Resolving these features often exceeds the reach of conventional laboratory tools, yet it is essential for the rational design of modern formulations. Synchrotron radiation, with its high brilliance, energy tunability, and penetrating power, offers a uniquely versatile platform to address this challenge.
This presentation introduces three complementary analytical capabilities available at the Pohang Light Source (PLS-II) and illustrates how they can be applied to cosmetic materials. Small-angle X-ray scattering (SAXS) probes nanoscale organization such as lamellar and micellar phases, liposomes, and emulsion structures that underlie product stability and rheology. X-ray imaging visualizes the three-dimensional morphology and phase distribution of emulsions, foam, and layered systems under near-native conditions. X-ray absorption fine structure (XAFS) reveals the local chemical state and coordination of key elements, for example the speciation of inorganic UV filters such as ZnO and TiO2 in sunscreens or trace metals in functional formulations. By presenting representative applications, this talk aims to demonstrate the practical value of synchrotron methods for both fundamental understanding and industrial product development in cosmetic science. Beyond the techniques themselves, we highlight the role of PLS-II and its industrial support activities as an accessible partner for the cosmetic community, and express our hope that closer collaboration between synchrotron facilities and industry will open new opportunities and accelerate innovation in this rapidly evolving field.
